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SID Vehicle Displays and Interfaces 2019:
"End-Of-Line Testing of Recent Display Quality Standards"


Silke R. Kirchner und Benjamin Kasdorf, Cameron R. Hughes, Nadine Götte
Mittwoch, den 25. September 2019, 9:15 – 9:35 Uhr, Session 5.4
Detroit, USA 

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CIE 2019 29th Quadrennial Session: "Evaluation of Blue Light Hazard"
Dr. Ðenan Konjhodžić
Tuesday June 18, 2019
Session PA3-2 "D2 - Measurement of SSL products" 09:20-10:20 am
Washington DC, USA

Abstract: The rapidly growing significance of modern solid state lighting (SSL) technology in our daily working and living environment raises important safety issues, such as the blue light hazard (BLH). The original IEC 62471 standard places high demands on measurement equipment and procedures for the reliable assessment of the BLH risk classes of light sources. Additionally, the IEC Technical Report 62778 explains how to apply the IEC 62741 for simple assessment of the BLH of lamps and luminaires with visible radiation. However, this has not yet become a standard. Currently, worldwide efforts are underway to elevate this report to a new standard and add more detailed measurement procedures for BLH assessment that are accessible to a broader community. We will evaluate and compare these methods using some practical measurements, and emphasize the advantages and disadvantages of each method. Every manufacturer should perform BLH assessment for the permission of new SLL products.

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SID Display Week:

1. "OLED vs. LC Displays - The Race toward Rec. 2020 and HDRI"
Dr. Michael Becker
Freitag, 17. Mai 2019, Session 83.1, 10:40-11:00 Uhr
Raum LL20A

Abstract: The authors present measurement procedures and results for state-of-the-art OLED and LC displays, characterizing chromaticity, luminance, and contrast with respect to viewing direction, electrical driving and ambient illumination, and data of reflective properties under hemispherical diffuse and directional illumination. The obstacles for realization of Rec. 2020 and HDRI are introduced and discussed.

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2. "Flicker from Electronic Displays: Reconsidering the Confusion"
Speaker: Michael Becker, Instrument Systems GmbH Munich Germany
Co-Chair: Jürgen Neumeier, Instrument Systems GmbH, Munich, Germany
Donnerstag, 16. Mai 2019, Session 50.1, 09:00-10:20 Uhr
Raum LL20A

Abstract: This paper discusses approaches to prediction of visual display flicker in different standards and their limitation to specific display technologies. The discrepancy between the methods of JEITA and VESA is analyzed and their consolidation is proposed. Recent activities for "time-modulated lighting systems" and their impact to application to displays are discussed.

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3. "Display Metrology: Basics, Framework, and Applications"
Dr. Michael Becker
Montag, 13. Mai 2019, Session 06, 10:20-11:50 Uhr
Room LL21ABC

Abstract: Based on typical application scenarios for electro-optical display screens, this seminar develops a generalized structure for display metrology and introduces the main components, their required features, and limitations. It presents a range of practical aspects of display metrology with focus on variations with viewing direction and on-display performance under ambient illumination at different temperatures as required for, e.g., automotive displays.

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International Conference on Display Technology: "Metrological Challenges of non-planar Displays"
Andreas Kreisel
Thursday, March 28 2019, 17:40 -18:00 am, ICDT 2019, Kunshan, Suzhou, China

Abstract: When new display technologies and trends enter the display market, adaptations or even new solutions for their standardized, i.e. comparable optical characterization are needed. Amongst new trends, curved and flexible displays are most likely to be adopted by the market because curvature opens up a variety of new possibilities in terms of design and applications. On the other hand, those displays also introduce challenges for display metrology [1, 2]. Here, we explain the basic differences between planar and cylindrical display screens during measurement of lateral and directional uniformity of luminance and chromaticity for both, imaging light measurement devices (ILMD), and spot light measurement devices (spot LMD). We will also show that no substantially new metrological methods are needed for the assessment of the optical characteristics of curved displays.

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Electronic displays conference: "The race toward Rec2020 and HDRI – OLED vs. LC display technology"
Dr. Michael Becker
Donnerstag, 28. Februar 2019, Session 08, 11:20 -11:40 Uhr

Abstract: Dr. Becker presents measurement results for state-of-the-art OLED and LC-display screens characterizing the stability of chromaticity and luminance with respect to viewing direction and electrical driving. Data concerning the reflective properties of both display technologies as a basis for comparison of display performance under ambient illumination are also shown. The obstacles that have to be overcome for realization of Rec. 2020 and HDRI are introduced and discussed for both OLED and LC-displays.

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Strategies in Light: "How Safe is Your Lighting Environment? An Evaluation Guide for Blue Light Hazard"
Dr. Ðenan Konjhodžić
Donnerstag 28. Februar 2019, 13:45 - 14:15 Uhr, Raum: Oceanside C, SiL 2019, Las Vegas, USA

Abstract: The rapidly growing significance of modern solid state lighting (SSL) technology in our daily working and living environment raises important safety issues, such as the blue light hazard (BLH). The original IEC 62471 standard places high demands on measurement equipment and procedures for the reliable assessment of the BLH risk classes of light sources. Additionally, the IEC Technical Report 62778 explains how to apply the IEC 62741 for simple assessment of the BLH of lamps and luminaires with visible radiation. However, this has not yet become a standard. Currently, worldwide efforts are underway to elevate this report to a new standard and add more detailed measurement procedures for BLH assessment that are accessible to a broader community. We will evaluate and compare these methods using some practical measurements, and emphasize the advantages and disadvantages of each method. Every manufacturer should perform BLH assessment for the permission of new SLL products.

Weitere Informationen auf der Veranstaltungsseite

"High Resolution Array Spectroradiometer for High Volume Laser Diode and VCSEL Testing"
Dr. Tobias Roesener
12.-13. November 2018, 5th International WORKshop on Infrared Technologies, München, Deutschland

Abstract: Laser diodes and particularly vertical-cavity surface-emitting lasers (VCSELs) experience an enormous market growth due to new applications and new technological approaches, e.g. infrared VCSELs are integrated in consumer electronics and direct diode lasers based on VCSEL arrays replace conventional laser systems. A high volume production due to the growing demand for laser diodes calls for fast and accurate production testing. Particularly VCSELs – in contrast to edge-emitting lasers (EEL) – allow additional testing on wafer level before singularizing because the laser cavity is already monolithically integrated in the epitaxial structure. Key measurement parameters are the peak wavelength and power of the devices. Established measurement technologies for laser diodes such as dispersive scanning spectrometry and Fourier-transform infrared spectroscopy (FTIR) allow very high spectral resolutions in combination with a high flexibility with respect to the spectral range under investigation. These properties result from a rotating mirror (scanning spectrometer) and a moving mirror (FTIR) and make these measurement systems very effective for product development and product specification in a laboratory environment ...

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"Workshop - Solid-State Lighting Measurements"
Dr. Ðenan Konjhodžić
Donnerstag 27. September 2018, 13 - 14:30 Uhr, Seefoyer, LpS 2018, Bregenz, Österreich

Abstract: The workshop covers the basics of test and measurements of solid-state lighting (SSL) products and is suitable for beginners as well as experts in the field. To provide the same level of knowledge for all participants, an introduction to SSL metrology and the relevant standards such as the first international SSL standard CIE S025 are given in the beginning. Basic quantities and principles in photometry and colorimetry will be defined and proper equipment for their determination will be presented. Important aspects for color characterization, such as correlated color temperature (CCT) and color rendering index (CRI) will be included as well. Participants will learn how to evaluate the optical performance of LEDs as basic components of SSL sources.  Afterwards, the most essential measurement procedures and used instrumentation in SSL measurements will be introduced with focus on goniophotometers and integrating spheres. Goniophotometric measurements provide details of the radiation patterns for different light sources and when correctly integrated, the total luminous flux is obtained ...

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„LED-Messtechnik für das Physik-Praktikum“
Maximilian Mayer
Donnerstag, 27. September 2018, zwischen 10-15 Uhr, 44. Praktikumsleitertagung 2018, Universität Paderborn, Deutschland

Abstract: Instrument Systems GmbH, gegründet 1986 in München, entwickelt, fertigt und vertreibt Komplettlösungen für die Lichtmesstechnik. Hauptprodukte sind Spektrometer in Array-Bauweise sowie Leuchtdichte- und Farbmesskameras. Die wesentlichen Einsatzgebiete liegen im Bereich der LED-/SSL- und Display-Messtechnik sowie Spektralradiometrie und Photometrie. Hier ist Instrument Systems heute einer der weltweit führenden Hersteller. Bei der 44. Praktikumsleitertagung an der Universität Paderborn wird das vielseitig einsetzbare Mini-Array-Spektrometer MAS 40 mit Zubehör zur Lichtstärke- sowie Lichtstrommessung vorgestellt. Das direkt auf das Zubehör absolut kalibrierte MAS 40 erfüllt alle von Instrument Systems garantierten Qualitätsanforderungen und gilt in der industriellen Qualitätskontrolle als auch in Forschung- sowie Entwicklungsbereichen als bewährtes und preisgünstiges Messsystem einer spannenden Zukunftsbranche.

Praktikumsleitertagung 2018

„Comprehensive Display Measurement“
Kevin Lange (Konica Minolta Sensing Americas Inc.) im Auftrag von Instrument Systems
Mittwoch 26. September 2018, 9:10–9:30 Uhr, SID Vehicle Displays and Interfaces, Livonia, USA

Vehicle Displays Detroit - 25th Annual Symposium & Expo

„Streulichtkorrektur für Array-Spektralradiometer“
Dr. Ðenan Konjhodžić
Dienstag 11. September 2018, 11.50 Uhr, Licht 2018, Davos, Schweiz

Abstract: Die wichtigste Einschränkung der Leistungsfähigkeit eines Array-Spektralradiometers in der Photometrie und Radiometrie ist das Auftreten von Streulicht. Dies bedeutet, dass ein bestimmtes Element des Array-Detektors durch Strahlung von einem anderen Spektralbereich als des angegebenen kontaminiert wird. In diesem Referat werden die Möglichkeiten der Streulichtkorrektur für Array- Spekralradiometer mit Hilfe von durchstimmbaren Laserquellen vorgestellt. Die Vorteile der Anwendung einer so bestimmten Streulichtmatrix bei verschiedenen Messungen werden hervorgehoben. Das Streulicht kann um etwa eine Größenordnung unterdrückt werden, wodurch insbesondere im UV-Bereich eine genauere Kalibrierung erzielt wird. Auch bei den sichtbaren LEDs wird eine genauere Bestimmung der Farbkoordinaten erreicht.

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„LED- und Displaymesstechnik“
Dr. Tobias Roesener
Donnerstag 13. September 2018, optence, Arbeitskreistreffen LED-Technik, Darmstadt, Deutschland

optence - Networking in photonics

Deutschland verfügt über zahlreiche mittelständische Unternehmen und Global Player mit erstklassigem Innovationspotenzial sowie hochkarätige Forschungseinrichtungen im Bereich der optischen Technologien. Zur Stärkung der Innovationskraft und der internationalen Wettbewerbsfähigkeit gewinnen Networking und Ressourcenbündelung zunehmend an Bedeutung. Als regionales Innovationsnetz Optische Technologien sorgt Optence e.V. seit vielen Jahren für die Vernetzung von Industrie und Forschung.